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UNE EN 61988-2-1:2012
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical (Endorsed by AENOR in June of 2012.)
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical (Endorsed by AENOR in June of 2012.)
Released: 2012-06-01
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UNE EN 61988-2-5:2012
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise (Endorsed by AENOR in October of 2012.)
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise (Endorsed by AENOR in October of 2012.)
Released: 2012-10-01
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UNE EN 61988-3-2:2009
Plasma display panels -- Part 3-2: Interface - Electrical interface (Endorsed by AENOR in March of 2010.)
Plasma display panels -- Part 3-2: Interface - Electrical interface (Endorsed by AENOR in March of 2010.)
Released: 2010-03-01
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128.70 EUR
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78.10 EUR
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UNE EN 62044-2:2005
Cores made of soft magnetic materials - Measuring methods -- Part 2: Magnetic properties at low excitation level (Endorsed by AENOR in September of 2005.)
Cores made of soft magnetic materials - Measuring methods -- Part 2: Magnetic properties at low excitation level (Endorsed by AENOR in September of 2005.)
Released: 2005-09-01
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79.20 EUR
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UNE EN 62047-1:2016
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (Endorsed by AENOR in May of 2016.)
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (Endorsed by AENOR in May of 2016.)
Released: 2016-05-01
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UNE EN 62047-19:2013
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (Endorsed by AENOR in November of 2013.)
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (Endorsed by AENOR in November of 2013.)
Released: 2013-11-01
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64.90 EUR
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