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UNE EN 6072:2010
Aerospace series - Metallic materials - Test methods - Constant amplitude fatigue testing (Endorsed by AENOR in August of 2010.)
Aerospace series - Metallic materials - Test methods - Constant amplitude fatigue testing (Endorsed by AENOR in August of 2010.)
Released: 2010-08-01
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108.90 EUR
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79.20 EUR
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UNE EN 60747-16-1:2002/A1:2007
Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001/A1:2007). (Endorsed by AENOR in May of 2007.)
Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001/A1:2007). (Endorsed by AENOR in May of 2007.)
Released: 2007-05-01
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UNE EN 60747-16-1:2002/A2:2017
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by Asociación Española de Normalización in July of 2017.)
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by Asociación Española de Normalización in July of 2017.)
Released: 2017-07-01
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UNE EN 60747-16-5:2013
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by AENOR in October of 2013.)
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by AENOR in October of 2013.)
Released: 2013-10-01
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64.90 EUR
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UNE EN 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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74.80 EUR
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62.70 EUR
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41.80 EUR
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41.80 EUR
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38.50 EUR
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